P. S. Ho Books

Thin films and interfaces
Thin Films Interfaces and Phenomena
Materials Reliability Issues in Microelectronics Materials Research Society Symposium Proceedings
Stress induced Phenomena in Metallization
Low Dielectric Constant Materials for IC Applications
Advanced interconnects for ULSI technology
Advanced interconnects for ULSI technology

By Ehrenfried Zschech, Mikhail Baklanov, P. S. Ho

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"This book presents an in-depth overview of present status, novel developments and new materials and approaches for advanced interconnect technology"--

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Electromigration in Metals
Thin Films Vol. 54
Advanced Interconnects for ULSI Technology
Electromigration in Metals

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