Way Kuo Books
Reliability, yield, and stress burn-in
By Way Kuo
Reliability, Yield, and Stress Burn-In explains reliability issues in Microelectronics Systems Manufacturing and Software Development with an emphasis on evolving manufacturing technology for the s...
Read MoreImportance measures in reliability risk and optimization
By Way Kuo
"Provides a comprehensive introduction to importance measures in reliability and optimization, allowing readers to address real, large-scale problems within various fields effectivelyThe book is di...
Read More