Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy: A Laboratory Workbook
Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy: A Laboratory Workbook Login for the JSON version of this page.
- Title
- Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy: A Laboratory Workbook
- ISBN-10
- 0-306-43591-8
- ISBN-13
- 978-0-306-43591-1
- Author(s)
- Patrick Echlin, John Armstrong, Alton D. Romig Jr., Klaus Rudiger Peters, Dale E. Newbury, David B. Williams, Charles E. Lyman, Charles Fiori, Joseph Goldstein, Eric Lifshin, David C. Joy
- Publisher
- Plenum Press, Springer
- Published
- 1990
- Format
- Paperback
- Subtitle
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- Series
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- Imprint
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- Pages
- 435
- Language
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- Subjects
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- Genre
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Description
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Metadata
- EAN
- 9780306435911
- ASIN
- 0306435918
- Prefix
- 978
- Group
- 0
- Group Name
- English language
- Group Identifier
- 978-0
- Registrant
- 306
- Publication
- 43591
- Check Digit
- 1
- Formatted
- 978-0-306-43591-1