David C. Joy Books
Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy: A Laboratory Workbook
By Patrick Echlin, John Armstrong, Alton D. Romig Jr., Klaus Rudiger Peters, Dale E. Newbury, David B. Williams, Charles E. Lyman, Charles Fiori, Joseph Goldstein, Eric Lifshin, David C. Joy
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Helium ion microscopy
By David C. Joy
Helium Ion Microscopy: Principles and Applications describes the theory and discusses the practical details of why scanning microscopes using beams of light ions – such as the Helium Ion Microscope...
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