Testing Complex and Embedded Systems

Name: Testing Complex and Embedded Systems
ISBN: 9781351688994

Testing Complex and Embedded Systems

by Kim H. Pries, Jon M. Quigley

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Title: Testing Complex and Embedded Systems
ISBN-10: 1-351-68899-5
ISBN-13: 978-1-351-68899-4
Author(s): Kim H. Pries, Jon M. Quigley
Publisher: Taylor & Francis
Published: 2018
Format: ePub

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Metadata

EAN: 9781351688994
ASIN: 1351688995
Prefix: 978
Group: 1
Group Name: English language
Group Identifier: 978-1
Registrant: 351
Publication: 68899
Check Digit: 4
Formatted: 978-1-351-68899-4

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