Testing Complex and Embedded Systems

Name: Testing Complex and Embedded Systems
ISBN: 9781351689007

Testing Complex and Embedded Systems

by Jon M. Quigley, Kim H. Pries

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Title: Testing Complex and Embedded Systems
ISBN-10: 1-351-68900-2
ISBN-13: 978-1-351-68900-7
Author(s): Jon M. Quigley, Kim H. Pries
Publisher: CRC Press
Published: 2018
Format: Kindle Edition

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Metadata

EAN: 9781351689007
ASIN: 1351689002
Prefix: 978
Group: 1
Group Name: English language
Group Identifier: 978-1
Registrant: 351
Publication: 68900
Check Digit: 7
Formatted: 978-1-351-68900-7

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