Scanning Electron Microscopy and X Ray Microanalysis

Scanning Electron Microscopy and X Ray Microanalysis Login for the JSON version of this page.

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Title: Scanning Electron Microscopy and X Ray Microanalysis
ISBN-10: 1-4939-6674-X
ISBN-13: 978-1-4939-6674-5
Author(s): Nicholas W. M. Ritchie, Dale E. Newbury, John Henry J. Scott, David C. Joy, Joseph I. Goldstein
Publisher: Springer
Published: 2017
Format
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Pages: 198
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Description

Metadata

EAN: 9781493966745
ASIN: 149396674X
Prefix: 978
Group: 1
Group Name: English language
Group Identifier: 978-1
Registrant: 4939
Publication: 6674
Check Digit: 5
Formatted: 978-1-4939-6674-5

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