Optical Scattering: Measurement And Analysis

By John C. Stover, Stover, John C.

xi, 238 pages : 23 cm Includes bibliographical references (pages 229-233) and index

Optical Scattering Applications Measurement And Theory Ii/V 1995: Applications, Measurement, And Theory Ii 15-16 July 1993, San Diego, California

By John C. Stover, Stover, Society Of Photo-Optical Instrumentation Engineers.

Optical Scatter: Applications, Measurement, And Theory : 24-26 July, 1991 San Diego, California

By John C. Stover, Stover, John C., Society Of Photo-Optical Instrumentation Engineers (U.S.), International Symposium On Optical Applied Science And Engineering, Optical Scatter: Applications, Measurement, And Theory

ix, 371 p. : 28 cm Includes bibliographical references and index

Surface Characterization For Computer Disc Wafers: 28 January 1999, San Jose, California

By John C. Stover, Sponsored By SPIE--The International Society For Optical Engineering, John C. Stover, Chair/Editor

vii, 136 p. : 28 cm Includes bibliographical references and index

Optical Scattering In The Optics, Semiconductor And Computer Disk Industries: 13-14 July 1995, San Diego, California

By John C. Stover, Society Of Photo-Optical Instrumentation Engineers., John C. Stover, Chair/Editor, Sponsored And Published By SPIE--The International Society For Optical Engineering

Surface Scatter -- Theory And Analysis -- Instrumentation. John C. Stover, Chair/editor ; Sponsored And Published By Spie--the International Society For Optical Engineering. Includes Bibliographica...

Optical Scattering: Measurement And Analysis (SPIE Press Monograph Vol. PM24) (Press Monographs)

By John C. Stover, Stover, John C.

As the authoritative resource on optical scattering, this book was developed from many years of teaching light-scatter measurement and analysis courses to optical engineers. Dr. Stover covers scatt...

Scatter From Optical Components

By John C. Stover, Sponsored By SPIE--The International Society For Optical Engineering, Cooperating Organizations, Applied Optics Laboratory/New Mexico State University ..., John C. Stover, Chair/Editor

vii, 451 p. : 28 cm Includes bibliographical references and index

Exploiting New Image Sources And Sensors

By John C. Stover, AIPR Workshop (26th 1997 Washington, D.C.), AIPR Workshop, Sponsored By SPIE--The International Society For Optical Engineering, AIPR Executive Committee, J. Michael Selander, J. Michael Selander, Chair/Editor

ix, 352 p. : 28 cm Includes bibliographical references and index

Flatness, Roughness, And Discrete Defects Characterization For Computer Disks, Wafers, And Flat Panel Displays Ii: 29-30 January 1998 San Jose, California

By John C. Stover, John C. Stover (Editor), Conference 'Flatness, Roughness, And Discrete Defects Characterization For Computer Disks, Wafers, And Flat Panel Displays'

vii, 186 p. : 28 cm Includes bibliographical references and index

Flatness, Roughness, And Discrete Defect Characterization For Computer Disks, Wafers, And Flat Panel Displays: 8-9 August 1996, Denver, Colorado

By John C. Stover, Society Of Photo-Optical Instrumentation Engineers.