John C. Stover (Editor) Books

Flatness, Roughness, And Discrete Defects Characterization For Computer Disks, Wafers, And Flat Panel Displays Ii: 29-30 January 1998 San Jose, California

By John C. Stover, John C. Stover (Editor), Conference 'Flatness, Roughness, And Discrete Defects Characterization For Computer Disks, Wafers, And Flat Panel Displays'

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vii, 186 p. : 28 cm Includes bibliographical references and index

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