Krishnendu Chakrabarty Books

Wafer level testing and test during burn in for integrated circuits Sudarshan Bahukudumbi Krishnendu Chakrabarty
Wafer level testing and test during burn in for integrated circuits Sudarshan Bahukudumbi Krishnendu Chakrabarty

By Sudarshan Bahukudumbi

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Wafer-level testing refers to a critical process of subjecting integrated circuits and semiconductor devices to electrical testing while they are still in wafer form. Burn-in is a temperature/bias...

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