Yervant Zorian Books

Principles of Testing Electronic Systems
Embedded Processor Based Self Test
Multi Chip Module Test Strategies
Multi Chip Module Test Strategies

By Yervant Zorian

Average: 0.00, 0 Ratings

MCMs today consist of complex and dense VLSI devices mounted into packages that allow little physical access to internal nodes. The complexity and cost associated with their test and diagnosis are...

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Multi-Chip Module Test Strategies
Multi-Chip Module Test Strategies

By Yervant Zorian

Average: 0.00, 0 Ratings

MCMs today consist of complex and dense VLSI devices mounted into packages that allow little physical access to internal nodes. The complexity and cost associated with their test and diagnosis are...

Read More
Embedded Processor Based Self Test
Collaboration and Technology
Principles of Testing Electronic Systems
Embedded Processor Based Self Test
Proceedings of the 50th Annual Design Automation Conference
Multi Chip Module Test Strategies

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