Greg Haugstad Books
Interfacial Properties On The Submicrometer Scale
By S. K. Sinha, Shengfu Chen, Zheng Huang, L. Leger, Rene M. Overney, J. De Coninck, Greg Haugstad, J. Klafter, Lingyan Li, Hyunjung Kim, Holger Schonherr, Victor Chechik, David N. Reinhoudt, Michael Urbakh, J. M. Drake, Ro, Vladimir V. Tsukruk, S. A. Syed Asif, Markus Porto, G. Julius Vancso, Scott S. Perry, Joseph Klafter, Buddy D. Ratner, Jurriaan Huskens, R. J. Colton, Jon A. Hammerschmidt, Wayne L. Gladfelter, Jane Frommer, Igor Luzinov, H. Hervet, Scott E. Sills, Charles J. M. Stirling, Ramon Colorado, Michael Graupe, Hyun I. Kim, Mitsuru Takenaga, Olugbenga Oloba, Seunghwan Lee, T. Randall Lee, Cynthia Buenviaje, Franco Dinelli, Marcel W. J. Beulen, Jürgen Bügler, Frank C. J. M. Van Veggel, O. H. Seeck, I. D. Kaendler, D. Shu, K. Shin, M. Rafailovich, J. Sokolov, M. Tolan, V. Pasquier, R. Pit, Shaoyi Jiang, Reto Luginbühl, K. J. Wahl, Judith A. Harrison, Steven J. Stuart, Alan B. Tutein, Valery Gorbunov, Nobi Fuchigami, Olga E. Shmakova, Ramon J. Villazana, Lauren K. Wolf, Yarjing J. Yang, Rebecca L. Pizzolatto, Marie C. Messmer, K. Cory Schomburg
Content: Constrained systems : caught between dimensions / René M. Overney and Scott E. Sills -- Is there an optimal substrate geometry for wetting (at the microscopic scale)? / J. De Coninck -- Ki...
Read More
Scanning Probe Microscopy Of Polymers
By Meyer, Manfred Radmacher, S. Gauthier, American Chemical Society. Meeting., Rene M. Overney, Ken Jacobson, A. Rosa, E.E Johnston, J. L. Bredas, Jean-Claude Wittmann, Bernard Lotz, A. HUBER, Greg Haugstad, Charles M. Lieber, P. Schmitz, John Wu, Martina Schumacher, Tisato Kajiyama, American Chemical Society. Division Of Polymer Chemistry., J. Lu, M De Vos, Atsushi Takahara, Wolfgang Stöcker, H. J. Guntherodt, Vladimir V. Tsukruk, B. D. Ratner, Sabine Gräff, Richard R. Jones, J. Swings, Buddy D. Ratner, Aleksandr Noy, O. Marti, Paul K. Hansma, T. Boland, Fla.) American Chemical Society Meeting 1996 Orlando, D. H. Reneker, I. Chun, Andrew J. Lovinger, G. J. Vansco, H. Schönherr, D. Snétivy, M. C. Goh, M. F. Paige, P. Markiewicz, I. Yadegari, M. Edirisinghe, S. Hild, Ph. Leclère, R. Lazzaroni, F. Gubbels, R. Deltour, R. Jérôme, M. P. Everson, M. Mikulec, Fabio Biscarini, Jan Domke, Christian Rotsch, Ch. Bourban, J. Mergaert, K. Ruffieux, E. Wintermantel, Shouren Ge, Ken Kojio, L. M. Eng, Jouko Peltonen, Tapani Viitala, Valery N. Bliznyuk, John L. Hazel, J. P. Aimé, Jon A. Hammerschmidt, Bahram Moasser, Wayne L. Gladfelter, R. Lüthi, M. Bammerlin, A. Baratoff, M. Guggisberg, Dmitri V. Vezenov
Content: Scanning probe microscopy in polymers : introductory notes / René M. Overney and Vladimir V. Tsukruk -- Morphology, folding, and the structure of polymer single crystals / D.H. Reneker and...
Read More
Atomic Force Microscopy
This bookenlightens readers onthe basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The mater...
Read More
