Jane Frommer Books

Interfacial Properties On The Submicrometer Scale

By S. K. Sinha, Shengfu Chen, Zheng Huang, L. Leger, Rene M. Overney, J. De Coninck, Greg Haugstad, J. Klafter, Lingyan Li, Hyunjung Kim, Holger Schonherr, Victor Chechik, David N. Reinhoudt, Michael Urbakh, J. M. Drake, Ro, Vladimir V. Tsukruk, S. A. Syed Asif, Markus Porto, G. Julius Vancso, Scott S. Perry, Joseph Klafter, Buddy D. Ratner, Jurriaan Huskens, R. J. Colton, Jon A. Hammerschmidt, Wayne L. Gladfelter, Jane Frommer, Igor Luzinov, H. Hervet, Scott E. Sills, Charles J. M. Stirling, Ramon Colorado, Michael Graupe, Hyun I. Kim, Mitsuru Takenaga, Olugbenga Oloba, Seunghwan Lee, T. Randall Lee, Cynthia Buenviaje, Franco Dinelli, Marcel W. J. Beulen, Jürgen Bügler, Frank C. J. M. Van Veggel, O. H. Seeck, I. D. Kaendler, D. Shu, K. Shin, M. Rafailovich, J. Sokolov, M. Tolan, V. Pasquier, R. Pit, Shaoyi Jiang, Reto Luginbühl, K. J. Wahl, Judith A. Harrison, Steven J. Stuart, Alan B. Tutein, Valery Gorbunov, Nobi Fuchigami, Olga E. Shmakova, Ramon J. Villazana, Lauren K. Wolf, Yarjing J. Yang, Rebecca L. Pizzolatto, Marie C. Messmer, K. Cory Schomburg

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Content: Constrained systems : caught between dimensions / René M. Overney and Scott E. Sills -- Is there an optimal substrate geometry for wetting (at the microscopic scale)? / J. De Coninck -- Ki...

Applications Of Scanned Probe Microscopy To Polymers

By Richard Law, Paul F. Barbara, Keiji Tanaka, Rene M. Overney, Gabor A. Somorjai, Francis M. Mirabella, Tisato Kajiyama, Atsushi Takahara, Y. H. Lin, Sergiy Minko, Manfred Stamm, Michael J. Fasolka, V. V. T͡Sukruk, Chris A. Michaels, Ph. Leclère, R. Lazzaroni, J. P. Aimé, Jane Frommer, James D. Batteas, Gilbert C. Walker, Roman Sheparovych, Robert Lupitskyy, Stephan J. Stranick, Jeffrey E. Hall, So-Jung Park, Anastasia Mardilovich, Sabah Al-Maawali, Yujie Sun, Andre J. Gesquiere, Doo Young Kim, Joseph M. Imhof, Eun-Soo Kwak, David A. Vanden Bout, Daniel A. Higgins, D. Bruce Chase, Boris B. Akhremitchev, Larissa Stebounova, Lori S. Goldner, Scott N. Goldie, V. Cornet, M. Surin, P. Viville, Scott Sills, Tomoko Gray, Aric Opdahl, H. Shulha, Pamela Y. Meadows, Jason E. Bemis, Nishant Bhasin, Dennis Discher, Efrosini Kokkoli, Jamie K. Hobbs, Andrew D. L. Humphris, Mervyn J. Miles, Anton Kiriy, Ganna Gorodyska, Constantinos Tsitsilianis

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scanning Probe Microscopy Is Capable Of Revealing Nanoscale Surface Structures And Mechanical Properties Of Single Molecules In Natural Polymers (such As Proteins) And Synthetic Polymers. The Edito...

How to Convert ISBN-10 to ISBN-13 (and Vice Versa): A Complete Guide

If you’re in the world of books—whether as a publisher, librarian, bookseller, or avid collector—you’ve likely come across the terms ISBN-10 and ISBN-13. Understanding these formats and knowing how to convert between them is essential for maintaining consistency and compatibility in book records. In this post, we’ll cover everything you need to know about ISBN conversions, step by step.

What is an EAN and How Does it Relate to an ISBN?

If you’ve ever purchased a product online or in a store, you’ve likely come across a barcode. Behind these barcodes lies a standardized system that makes modern commerce possible. Two key codes often encountered are the EAN (European Article Number) and ISBN (International Standard Book Number). But what are they, how are they connected, and why are they so crucial? Let’s explore.