V. Pasquier Books

Interfacial Properties On The Submicrometer Scale
Interfacial Properties On The Submicrometer Scale

By S. K. Sinha, Shengfu Chen, Zheng Huang, L. Leger, Rene M. Overney, J. De Coninck, Greg Haugstad, J. Klafter, Lingyan Li, Hyunjung Kim, Holger Schonherr, Victor Chechik, David N. Reinhoudt, Michael Urbakh, J. M. Drake, Ro, Vladimir V. Tsukruk, S. A. Syed Asif, Markus Porto, G. Julius Vancso, Scott S. Perry, Joseph Klafter, Buddy D. Ratner, Jurriaan Huskens, R. J. Colton, Jon A. Hammerschmidt, Wayne L. Gladfelter, Jane Frommer, Igor Luzinov, H. Hervet, Scott E. Sills, Charles J. M. Stirling, Ramon Colorado, Michael Graupe, Hyun I. Kim, Mitsuru Takenaga, Olugbenga Oloba, Seunghwan Lee, T. Randall Lee, Cynthia Buenviaje, Franco Dinelli, Marcel W. J. Beulen, Jürgen Bügler, Frank C. J. M. Van Veggel, O. H. Seeck, I. D. Kaendler, D. Shu, K. Shin, M. Rafailovich, J. Sokolov, M. Tolan, V. Pasquier, R. Pit, Shaoyi Jiang, Reto Luginbühl, K. J. Wahl, Judith A. Harrison, Steven J. Stuart, Alan B. Tutein, Valery Gorbunov, Nobi Fuchigami, Olga E. Shmakova, Ramon J. Villazana, Lauren K. Wolf, Yarjing J. Yang, Rebecca L. Pizzolatto, Marie C. Messmer, K. Cory Schomburg

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Content: Constrained systems : caught between dimensions / René M. Overney and Scott E. Sills -- Is there an optimal substrate geometry for wetting (at the microscopic scale)? / J. De Coninck -- Ki...

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