Scott E. Sills Books

Interfacial Properties On The Submicrometer Scale : [Developed From A Symposium Sponsored By The Division Of Colloid And Surface Chemistry At The 218th National Meeting Of The American Chemical Society, New Orleans, Louisiana, August 22-26, 1999
Interfacial Properties On The Submicrometer Scale : [Developed From A Symposium Sponsored By The Division Of Colloid And Surface Chemistry At The 218th National Meeting Of The American Chemical Society, New Orleans, Louisiana, August 22-26, 1999

By S. K. Sinha, Shengfu Chen, Zheng Huang, L. Leger, Rene M. Overney, J. De Coninck, Greg Haugstad, J. Klafter, Lingyan Li, Hyunjung Kim, Holger Schonherr, Victor Chechik, David N. Reinhoudt, Michael Urbakh, J. M. Drake, Ro, Vladimir V. Tsukruk, S. A. Syed Asif, Markus Porto, G. Julius Vancso, Scott S. Perry, Joseph Klafter, Buddy D. Ratner, Jurriaan Huskens, R. J. Colton, Jon A. Hammerschmidt, Wayne L. Gladfelter, Jane Frommer, Igor Luzinov, H. Hervet, Scott E. Sills, Charles J. M. Stirling, Ramon Colorado, Michael Graupe, Hyun I. Kim, Mitsuru Takenaga, Olugbenga Oloba, Seunghwan Lee, T. Randall Lee, Cynthia Buenviaje, Franco Dinelli, Marcel W. J. Beulen, Jürgen Bügler, Frank C. J. M. Van Veggel, O. H. Seeck, I. D. Kaendler, D. Shu, K. Shin, M. Rafailovich, J. Sokolov, M. Tolan, V. Pasquier, R. Pit, Shaoyi Jiang, Reto Luginbühl, K. J. Wahl, Judith A. Harrison, Steven J. Stuart, Alan B. Tutein, Valery Gorbunov, Nobi Fuchigami, Olga E. Shmakova, Ramon J. Villazana, Lauren K. Wolf, Yarjing J. Yang, Rebecca L. Pizzolatto, Marie C. Messmer, K. Cory Schomburg

Average: 0.00, 0 Ratings

Content: Constrained systems : caught between dimensions / René M. Overney and Scott E. Sills -- Is there an optimal substrate geometry for wetting (at the microscopic scale)? / J. De Coninck -- Ki...

Read More

Related Articles from our Blog

What is an EAN and How Does it Relate to an ISBN?

If you’ve ever purchased a product online or in a store, you’ve likely come across a barcode. Behind these barcodes lies a standardized system that makes modern commerce possible. Two key codes often encountered are the EAN (European Article Number) and ISBN (International Standard Book Number). But what are they, how are they connected, and why are they so crucial? Let’s explore.

Read More